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Washington University in St. Louis

Automated Flake Finding of Atomically-Thin Materials

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  • Introduction and Team
  • Classification Methods
    • Edge Detection + Contours
    • Size Filtration
    • Thickness Classification
  • Deliverables and Results
    • Algorithm Results
    • Database
  • Limitations and Future Work

Classification Methods

Edge Detection
Size Filtering
Thickness Classifying
Database

  • Classification Methods
    • Edge Detection + Contours
    • Size Filtration
    • Thickness Classification

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